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Volumn 159-160, Issue C, 2009, Pages 242-247
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Surface passivation at low temperature of p- and n-type silicon wafers using a double layer a-Si:H/SiNx:H
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Author keywords
Amorphous silicon; ECR PECVD; ERDA; FTIR; Passivation; Silicon nitride
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Indexed keywords
AMORPHOUS SILICON;
HYDROGEN;
HYDROGENATION;
OPTICAL PROPERTIES;
PASSIVATION;
SILICON WAFERS;
TEMPERATURE;
A-SI:H;
DOUBLE LAYERS;
ECR-PECVD;
ELASTIC RECOIL DETECTION ANALYSIS;
FTIR;
LOWS-TEMPERATURES;
N TYPE SILICON;
P AND N TYPES;
P-TYPE SILICON;
SURFACE PASSIVATION;
SILICON NITRIDE;
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EID: 67349131865
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mseb.2009.02.009 Document Type: Article |
Times cited : (29)
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References (18)
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