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Volumn 159-160, Issue C, 2009, Pages 242-247

Surface passivation at low temperature of p- and n-type silicon wafers using a double layer a-Si:H/SiNx:H

Author keywords

Amorphous silicon; ECR PECVD; ERDA; FTIR; Passivation; Silicon nitride

Indexed keywords

AMORPHOUS SILICON; HYDROGEN; HYDROGENATION; OPTICAL PROPERTIES; PASSIVATION; SILICON WAFERS; TEMPERATURE;

EID: 67349131865     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2009.02.009     Document Type: Article
Times cited : (29)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.