SIMION modeling of ion image charge detection in Fourier transform ion cyclotron resonance mass spectrometry

International Journal of Mass Spectrometry

Volumn 283, Issue 1-3, 2009, Pages 100-104

  Hendrickson, Christopher L ^a   Beu, Steven C ^b   Blakney, Greg T ^a   Marshall, Alan G ^a  

^a FLORIDA STATE UNIVERSITY   (United States)

^b SC Beu Consulting   (United States)

Author keywords

FT ICR; FTMS; ICR; Image charge detection; Magnetron

Indexed keywords

EID: 67349125133     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2009.02.009     Document Type: Article

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