Impact ionization and Auger recombination at high carrier temperature

Solar Energy Materials and Solar Cells

Volumn 93, Issue 6-7, 2009, Pages 797-802

  Takeda, Yasuhiko ^a   Ito, Tadashi ^a   Suzuki, Ryo ^a   Motohiro, Tomoyoshi ^a   Shrestha, Santosh ^b   Conibeer, Gavin ^b  

^a Rd Management Section   (Japan)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Auger recombination; Hot carrier solar cells; Hot carriers; Impact ionization

Indexed keywords

APPLIED VOLTAGES; AUGER RECOMBINATION; CARRIER TEMPERATURES; PHOTO-GENERATED CARRIERS; PICOSECONDS; RETENTION TIME; SOLAR IRRADIATIONS; THERMALIZATION;

AUGERS; CELL MEMBRANES; CONVERSION EFFICIENCY; HOT CARRIERS; IRRADIATION; MOSFET DEVICES; PHOTOVOLTAIC CELLS; SEMICONDUCTOR QUANTUM DOTS; SOLAR CELLS;

IMPACT IONIZATION;

EID: 67349119524     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2008.09.053     Document Type: Article

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