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Volumn , Issue , 2008, Pages 299-300

Vulnerability discovery modeling using weibull distribution

Author keywords

[No Author keywords available]

Indexed keywords

BEST FIT; LOGISTIC MODELS; NEW MODEL; RELIABILITY EVALUATION; SOFTWARE SYSTEMS; VULNERABILITY DISCOVERY;

EID: 67249141121     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSRE.2008.32     Document Type: Conference Paper
Times cited : (43)

References (6)
  • 2
    • 41449117969 scopus 로고    scopus 로고
    • Application of vulnerability discovery models to major operating systems
    • March
    • O. H. Alhazmi and Y. K. Malaiya, Application of Vulnerability Discovery Models to Major Operating Systems, IEEE Trans. Reliability, March 2008, pp. 14- 22.
    • (2008) IEEE Trans. Reliability , pp. 14-22
    • Alhazmi, O.H.1    Malaiya, Y.K.2
  • 3
    • 0008065111 scopus 로고
    • The weibull function: A new method of comparing seed vior
    • Bonner, F.T., and T.R. Dell, The Weibull function: A new method of comparing seed vior, Journal of Seed Technology, 1976, pp. 96-103.
    • (1976) Journal of Seed Technology , pp. 96-103
    • Bonner, F.T.1    Dell, T.R.2
  • 4
    • 84868975457 scopus 로고    scopus 로고
    • Weibull Distribution. Available,August 10
    • Boost Software. Weibull Distribution. Available: http://www.boost.org/ doc/libs/1-35-0/libs/math/doc/sf-and-dist/html/math-toolkit/dist/dist-ref/dists/ weibull.ht ml, August 10, 2008.
    • (2008) Boost Software
  • 5
    • 59449108823 scopus 로고    scopus 로고
    • National Institute of Standards and Technology,Available,March 31
    • National Institute of Standards and Technology. National Vulnerability Database. Available:http://nvd. nist.gov/download.cfm, March 31, 2008.
    • (2008) National Vulnerability Database
  • 6
    • 0036507780 scopus 로고    scopus 로고
    • Distinguishing between lognormal and Weibull distributions
    • DOI 10.1109/24.994903, PII S0018952902026039
    • Cain, S.R., Distinguishing between lognormal and Weibull distributions, IEEE Trans. Reliability, March 2002, pp. 32-38. (Pubitemid 34630920)
    • (2002) IEEE Transactions on Reliability , vol.51 , Issue.1 , pp. 32-38
    • Cain, S.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.