Distinguishing between lognormal and Weibull distributions

IEEE Transactions on Reliability

Volumn 51, Issue 1, 2002, Pages 32-38

  Cain, Stephen R ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

Parameter estimation; Regression analysis; Reliability modeling; Reliability statistics

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; MATHEMATICAL MODELS; MONTE CARLO METHODS; PARAMETER ESTIMATION; PROBABILITY; REGRESSION ANALYSIS; STATISTICAL TESTS; WEIBULL DISTRIBUTION;

LOGNORMAL DISTRIBUTION; STANDARD DEVIATION; WEIBULL PROBABILITY;

RELIABILITY;

EID: 0036507780     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.994903     Document Type: Article

References (5)

1. The time of 'guessing' young failure time distribution is over
2. Failure '97