A model of grain boundary diffusion in polycrystals with evolving microstructure

International Journal of Materials Research

Volumn 100, Issue 4, 2009, Pages 530-535

  Klinger, Leonid ^a   Rabkin, Eugen ^a,b  

^a Department of Materials Engineering ^*  (Israel)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Diffusion; Grain boundaries; Grain growth; Nanocrystalline materials; Thin films

Indexed keywords

ANALYTICAL EXPRESSIONS; AVERAGE CONCENTRATION; DIFFUSION PROFILES; DIFFUSION ZONES; GRAIN GROWTH EXPONENT; GRAIN-BOUNDARY DIFFUSION; GROWTH CONSTANTS; INDEPENDENT SET; INSTANTANEOUS SOURCE; MICROSTRUCTURE CHARACTERIZATION; NORMAL GRAIN GROWTH; PRACTICAL METHOD;

DIFFUSION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; NANOCRYSTALLINE MATERIALS; POLYCRYSTALS; THIN FILMS;

GRAIN GROWTH;

EID: 67149144483     PISSN: 18625282     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.110068     Document Type: Article

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