In situ X-ray diffraction study on the orientation-dependent Thermal Expansion of cu nanowires

Journal of Physical Chemistry C

Volumn 113, Issue 22, 2009, Pages 9568-9572

  Zhou, Wen Fei ^a   Fei, Guang Tao ^a   Li, Xin Feng ^a   Xu, Shao Hui ^a   Chen, Li ^a   Wu, Bing ^a   Zhang, Li De ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED SAMPLES; COEFFICIENTS OF THERMAL EXPANSIONS; CU NANOWIRES; ELECTROCHEMICAL METHODS; IN-SITU; POROUS ANODIC ALUMINA MEMBRANES; PREFERRED ORIENTATIONS; TEMPERATURE RANGE; XRD;

ANNEALING; DIFFRACTION; ELECTRIC WIRE; NANOWIRES; THERMAL STRESS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

THERMAL EXPANSION;

EID: 67149105647     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp900047q     Document Type: Article

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