Production of a positron microprobe using a transmission remoderator

Analytical Sciences

Volumn 24, Issue 1, 2008, Pages 73-79

  Fujinami, Masanori ^a   Jinno, Satoshi ^a   Fukuzumi, Masafumi ^a   Kawaguchi, Takumi ^a   Oguma, Koichi ^a   Akahane, Takashi ^b  

^a CHIBA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; EFFICIENCY; ELECTRONS; ELECTROSTATIC LENSES; MAGNETIC LENSES; MAGNETISM; PARTICLE BEAMS; SCATTERING PARAMETERS; TRANSMISSIONS;

DEFECT DISTRIBUTION; POSITRON MICROPROBE; POSITRON SOURCES; PRODUCTION METHODS; TOTAL EFFICIENCY; TRANSMISSION GEOMETRIES; TRANSPORT EFFICIENCY; VACANCY-TYPE DEFECTS;

POSITRONS;

EID: 43949128372     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.24.73     Document Type: Article

References (24)

1. R. Krause-Rehberg and H. S. Leipner, "Positron Annihilation in Semiconductors - Defect Studies", 1999, Springer-Verlag, Berlin.
2. P. G. Coleman, "Positron Beams and their Applications", 2000, World Scientific Publishing, Singapore.
3. P. J. Schultz and K. G. Lynn, Rev. Mod. Phys., 1988, 60, 701.
4. J. M. Dale, L. D. Hulett, and S. Pendyala, Surf. Inter. Anal., 1980, 2, 199.
5. D. A. Fischer, K. G. Lynn, and D. W. Gidley, Phys. Rev. B, 1986, 33, 4479.
6. E. M. Gullikson, A. P. Mills, Jr., W. S. Crane, and B. L. Brown, Phys. Rev. B, 1985, 32, 5484.
7. G. R. Brandes, K. F. Canter, T. N. Horsky, P. H. Lippel, and A. P. Mills, Jr., Rev. Sci. Instrum., 1988, 59, 228.
8. T. Roach, A. Bakshi, and K. F. Canter, Meas. Sci. Technol., 1995, 6, 496.
9. G. Amarendra, K. F. Canter, and D. C. Schoepf, J. Appl. Phys., 1996, 80, 4660.
10. X. M. Chen, K. F. Canter, C. B. Duke, A. Paton, D. L. Lessor, and W. K. Ford, Phys. Rev. B, 1993, 48, 2400.
11. K. F. Canter, G. Amarendra, D. Vasumathi, S. A. Wesley, R. Xie, A. P. Mills, Jr., R. L. Sabatini, and Y. Zhu, Appl. Surf. Sci., 1995, 85, 339.
12. W. Triftshäuser, G. Kögel, P. Sperr, D. T. Britton, K. Uhlmann, and P. Wilutzki, Phys. Rev. B, 1997, 130, 264.
13. A. David, G. Kögel, P. Sperr, and W. Triftshäuser, Phys. Rev. Lett., 2001, 87, 067402.
14. H. Greif, M. Haaks, U. Holzwarth, U. Männig, M. Tongbhoyai, T. Wider, K. Maier, U. Bihr, and B. Huber, Appl. Phys. Lett., 1997, 71, 2115.
15. R. Suzuki, Y. Kobayashi, T. Mikado, H. Ohgaki, M. Chiwaki, T. Yamazaki, and T. Tomimasu, Jpn. J. App. Phys., 1991, 30, L532.
16. T. Kurihara, Y. Nagashima, T. Shidara, H. Nakajima, S. Ohsawa, M. Ikeda, T. Oogoe, K. Kakihara, Y. Ogawa, A. Shirakawa, K. Furukawa, T. Sanami, and A. Enomoto, Mater. Sci. Forum, 2004, 445 -446, 486.
17. C. Hugenschmidt, G. Kögel, K. Schreckenbach, P. Sperr, M. Springer, B. Straßer, and W. Triftshäuser, Appl. Surf. Sci., 1999, 149, 7.
18. W. Stoeffl, P. Asoka-Kumar, and R. Howell, Appl. Surf. Sci., 1999, 149, 1.
19. K. F. Canter and A. P. Mills, Jr., Can. J. Phys., 1982, 60, 551.
20. D. M. Chen, K. G. Lynn, R. Pareja, and B. Nielsen, Phys. Rev. B, 1985, 31, 4123.
21. P. J. Schultz, E. M. Gullikson, and A. P. Mills, Jr., Phys. Rev. B, 1986, 34, 442.
22. The site of the thin film laboratory, Department of Physics and Astronomy, at the University of Aarhus, http://www.phys.au.dk/thinfilm/uk/.
23. Unpublished data.
24. M. Fujinami and N. B. Chilton, Appl. Phys. Lett., 1993, 62, 1131.