Integrated photonic crystal spectrometers for sensing applications

Optics Communications

Volumn 282, Issue 15, 2009, Pages 3168-3171

  Momeni, Babak ^a   Hosseini, Ehsan Shah ^a   Askari, Murtaza ^a   Soltani, Mohammad ^a   Adibi, Ali ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1550 NM; CENTER WAVELENGTH; CRYSTAL SPECTROMETER; DIFFRACTION COMPENSATION; INTEGRATED PHOTONICS; NEGATIVE REFRACTIONS; ON CHIPS; OUTPUT SIGNAL-TO-NOISE RATIOS; SENSING APPLICATIONS; SIGNAL ISOLATION; SPECTRAL FEATURE; SPECTRAL PATTERNS; STRONG DISPERSION; SUPERPRISM;

CRYSTAL ATOMIC STRUCTURE; PHOTONIC CRYSTALS; SIGNAL TO NOISE RATIO; X RAY SPECTROMETERS;

SPECTROMETRY;

EID: 66949181445     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2009.04.052     Document Type: Article

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