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Volumn 7021, Issue , 2008, Pages

Modelling radiation damage to ESA's Gaia satellite CCDs

Author keywords

Astrometry; CCDs; Focal plane; Gaia

Indexed keywords

3D ELECTRON; ASTROMETRY; CCDS; CHARGE TRANSFER INEFFICIENCY; CHARGE TRAPPING EFFECT; DEVICE MODELLING; FOCAL PLANE; GAIA; GAIA SATELLITE; HIGH-PRECISION; RADIATION CALIBRATION;

EID: 66749167042     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.790968     Document Type: Conference Paper
Times cited : (29)

References (22)
  • 4
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    • Statistics of the recombinations of holes and electrons
    • Shockley, W. and Read, W. T. Jr., "Statistics of the Recombinations of Holes and Electrons", Physical Review, 87(5), 835-842 (1952).
    • (1952) Physical Review , vol.87 , Issue.5 , pp. 835-842
    • Shockley, W.1    Read Jr., W.T.2
  • 5
    • 36149004075 scopus 로고
    • Electron-hole recombination in germanium
    • Hall, R. N., "Electron-Hole Recombination in Germanium", Physical Review, 87(5), 387-387 (1952).
    • (1952) Physical Review , vol.87 , Issue.5 , pp. 387-387
    • Hall, R.N.1
  • 10
    • 79956126162 scopus 로고    scopus 로고
    • Modelling radiation damage effects for Gaia: A first-order charge distortion model (CDM-01)
    • Lindegren, L., "Modelling radiation damage effects for Gaia: A first-order Charge Distortion Model (CDM-01)", internal Gaia Livelink, GAIA-C5-TN-LL-075 (2008).
    • (2008) Internal Gaia Livelink, GAIA-C5-TN-LL-075
    • Lindegren, L.1
  • 14
    • 66749093156 scopus 로고    scopus 로고
    • A physical model of electron trapping effects in gaia (TDI mode) CCDs
    • Short, A., "A Physical Model of Electron Trapping Effects in Gaia (TDI mode) CCDs", internal Gaia Livelink, GAIA-CH-TN-ESA-AS-012 (2007).
    • (2007) Internal Gaia Livelink, GAIA-CH-TN-ESA-AS-012
    • Short, A.1
  • 18
    • 0032047627 scopus 로고    scopus 로고
    • Charge transfer efficiency in proton damaged CCD's
    • PII S0018949998028366
    • Hardy, T., Murowinski, R., Deen, M. J., "Charge Transfer Efficiency in Proton Damaged CCDs", IEEE Trans. Nuclear Sci., 45, 154 (1998). (Pubitemid 128741074)
    • (1998) IEEE Transactions on Nuclear Science , vol.45 , Issue.2 , pp. 154-163
    • Hardy, T.1    Murowinski, R.2    Deen, M.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.