Crystalline phase reduction of cuprous oxide (CU 2O) nanoparticles accompanied by a morphology change during ethanol-assisted spray pyrolysis

Langmuir

Volumn 25, Issue 12, 2009, Pages 7063-7071

  Firmansyah, Dudi Adi ^a   Kim, Taeil ^a   Kim, Songkil ^a   Sullivan, Kyle ^b   Zachariah, Michael R ^b   Lee, Donggeun ^a  

^a Pusan National University   (South Korea)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER NITRATE; COSOLVENT; CRYSTALLINE PHASE; CUPROUS OXIDE; DIRECT PATHS; EXPERIMENTAL OBSERVATION; FORCE BALANCES; GASPHASE; HIGHER TEMPERATURES; METALLIC COPPER; MORPHOLOGY CHANGES; REACTION PATHWAYS; SOLID-PHASE; STRUCTURAL INSTABILITY; SYNTHESIS TEMPERATURES; TRANSFORMATION KINETICS;

COPPER OXIDES; ETHANOL; MORPHOLOGY; NANOPARTICLES; NITROGEN COMPOUNDS; REACTION KINETICS;

SPRAY PYROLYSIS;

EID: 66749165283     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9001175     Document Type: Article

References (39)

1. Li, C.-L.; Fu, Z.-W. Electrochim. Acta 2008, 53, 4293-4301.
2. Lambert, S.; Cellier, C.; Gaigneaux, E. M.; Pirard, J. P.; Heinrichs, B. Catal. Commun. 2007, 8, 1244-1248.
3. Liu, Z.; Bando, Y. Adv. Mater. 2003, 15, 303-305.
4. Valentini, F.; Biagiotti, V.; Lete, C.; Palleschi, G.; Wang, J. Sens. Actuators, B 2007, 128, 326-333.
5. Dhas, N. A.; Raj, C. P.; Gedanken, A. Chem. Mater. 1998, 10, 1446-1452.
6. Kim, Y. H.; Lee, D. K.; Cha, H. G.; Kim, C. W.; Kang, Y. C.; Kang, Y. S. J. Phys. Chem. B 2006, 110, 24923-24928.
7. Athanassiou, E. K.; Grass, R. N.; Stark, W. J. Nanotechnology 2006, 17, 1668-1673.
8. Kang, Y. C.; Park, S. B.; Kang, Y. W. Nanostruct. Mater. 1995, 5, 777-791.
9. Hahn, H.; Eastman, J. A.; Siegel, R. W. Ceram. Trans. 1988, IB, 1115.
10. Hahn, H.; Averbeck, R. S. J. Appl Phys. 1990, 67, 1113.
11. Vollath, D.; Sickafus, K. E. Nanostruct. Mater. 1992, 1, 427.
12. Lyons, S. W.; Wang, L. M.; Kodas, T. T. Nanostruct. Mater. 1992, 1, 283.
13. Kaneko, K.; Moon, W.-J.; Inoke, K.; Horita, Z.; Ohara, S.; Adschiri, T.; Hiroya A. H.; Naito, M. Mater. Sci. Eng. A Struct. 403, 32-36.
14. Kawano, M.; Yoshida, H.; Hashino, K.; Ijichi, H.; Suda, S.; Kawahara, K.; Inagaki, T. J. Power Sources 2007, 173, 45-52.
15. Michel, C. R.; Lopez, E. R. Mater. Res. Bull 2006, 41, 209-216.
16. Kang, H. S.; Kang, Y. C.; Park, H. D.; Shul, Y. G. Mater. Lett. 2003, 57, 1288-1294.
17. Kim, J. H.; Germer, T. A.; Mulholland, G. W.; Ehrman, S. H. Adv. Mater. 2002, 14(1), 518-521.
18. Jayanthi, G. V.; Zhang, S. C.; Messing, G. L. Aerosol Sci. Technol 1993, 19, 478.
19. Majumdar, D.; Shefelbine, T. A.; Kodas, T. T. J. Mater. Res. 1996, 11, 2861-2868.
20. Kim, J. H.; Babushok, V. I.; Germer, T. A.; Mulholland, G. W.; Ehrman, S. H. J. Mater. Res. 2003, 18, 1614-1622.
21. Lee, S. G.; Choi, S. M.; Lee, D. Thermochim. Acta 2007, 455(1-2), 138-147.
22. Mahadevan, R.; Lee, D.; Sakurai, H.; Zachariah, M. R. J. Phys. Chem. A 2002, 106, 11083-11092.
23. Lee, D.; Park, K.; Zachariah, M. R. Aerosol Sci. Technol. 2005, 39(2), 162-169.
24. Willeke, K.; Baron, P. A. Aerosol Measurement: Principle, Techniques, and Applications; Van Nostrand Reinhold: New York, 1993.
25. Okuyama, K.; Lenggoro, I. W. Chem. Ens. Sci. 2003, 58, 537-547.
26. Lenggoro, I. W.; Hata, T.; Iskandar, F.; Lunden, M. M.; Okuyama, K. J. Mater. Res. 2000, 15, 733-743.
27. Kim, S. H.; Liu, B. Y. H.; Zachariah, M. R. Chem. Mater. 2002, 14, 2889-2899.
28. Reid, R. G.; Prausnitz, J. M.; Poling, B. E. The Properties of Gases and Liquids, 4th ed.; McGraw-Hill: New York, 1987.
29. Kim, J. Y.; Rodriguez, J. A.; Hanson, J. C.; Frenkel, A. L.; Lee, P. L. J. Am. Chem. Soc. 2003, 125, 10684-10692.
30. Tanaka, H. Thermochim. Acta 1995, 267, 29-44.
31. Qin, W.; Nagase, T.; Umakoshi, Y. J. Appl. Phys. 2007, 102, 124303.
32. Jeurgens, L. P. H.; Sloof, W. G.; Tichelaar, F. D.; Mittemeijer, E. J. Phys. Rev. B 2000, 62, 4707.
33. Smith, D. L. Thin-Film Deposition: Principles and Practice; McGraw-Hill: New York, 1995; Chapter 6.
34. Joint Committee on Powder Diffraction Standards - International Centre for Diffraction Data (JCPDS-ICCD) PCPDFWIN software; version 1.30, 1997.
35. Girifalco, L. A.; Weizer, V. G. Phys. Rev. B 1959, 114, 687.
36. Pienkos, T.; Gladyszewski, L.; Proszynski, A.; Chocyk, D.; Gladyszewski, G.; Martin, F.; Jaouen, C.; Drouet, M.; Lamongie, B. Vacuum 2003, 70, 243-248.
37. Zhou, G.; Yang, J. C. Phys. Rev. Lett. 2004, 93, 226101.
38. Jiang, Y.; Adams, J. B.; Sun, D. J. Phys. Chem. B 2004, 108, 12851.
39. Vitos, L.; Ruban, A. V.; Skriver, H. L.; Kollar, J. Surf. Sci. 1998, 411, 186.