A theory for image persistence in HgCdTe photodiodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7021, Issue , 2008, Pages

  Smith, Roger M ^a   Zavodny, Maximilian ^a   Rahmer, Gustavo ^a   Bonati, Marco ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b CERRO TOLOLO INTER AMERICAN OBSERVATORY   (Chile)

Author keywords

1.7 m cutoff; Charge traps; Depletion region; HgCdTe; Persistence; Remnant image

Indexed keywords

CHARGE TRAPS; DEPLETION REGION; HGCDTE; PERSISTENCE; REMNANT IMAGE; CHARGE EMISSION; CHARGE TRAP; CURRENT FRAME; DECAY CURVES; FORWARD BIAS; HGCDTE DETECTORS; HGCDTE PHOTODIODES; MULTIPLE MEASUREMENTS; NOISE FLOOR; SIGNAL RANGE; TELEDYNE; TEMPORAL RESPONSE; TIME-SCALE;

ASTROPHYSICS; CHARGE TRAPPING; DETECTORS; HETEROJUNCTION BIPOLAR TRANSISTORS; INFRARED DETECTORS; PHOTODIODES; CALIBRATION; DECAY (ORGANIC); MERCURY COMPOUNDS; PIXELS; SYSTEMATIC ERRORS;

MERCURY COMPOUNDS; DETECTORS;

EID: 66749155934     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.789372     Document Type: Conference Paper

References (4)

1. Smith, R.M., Zavodny, M, Rahmer, G. and Bonati, M., "Calibration of image persistence in HgCdTe photodiodes" Proc.SPIE 7021, paper 23 (2008)
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