Hard x-ray and gamma-ray imaging and spectroscopy using scintillators coupled to silicon drift detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7021, Issue , 2008, Pages

  Lechner, P ^a,b   Eckhard, R ^a,b   Fiorini, C ^d,e   Gola, A ^d,e   Longoni, A ^d,e   Niculae, A ^a,b   Peloso, R ^d,e   Soltau, H ^a,b   Struder L ^a,c  

^a MPI HALBLEITERLABOR   (Germany)

^b PNSENSOR GMBH   (Germany)

^c MPI für extraterrestrische Physik ^*  (Germany)

^d POLITECNICO DI MILANO   (Italy)

^e INFN SEZIONE DI MILANO   (Italy)

Author keywords

ray imaging; ray spectroscopy; Scintillator; Silicon drift detector; X ray imaging; X ray spectroscopy

Indexed keywords

-RAY IMAGING; -RAY SPECTROSCOPY; SCINTILLATOR; SILICON DRIFT DETECTOR; X-RAY IMAGING;

ASTROPHYSICS; CADMIUM COMPOUNDS; INFRARED DETECTORS; IONIZATION; LUMINESCENCE; MAGNETIC FIELDS; METAL DETECTORS; PHOSPHORS; PHOTOMULTIPLIERS; PHOTONS; REFLECTIVE COATINGS; SCINTILLATION; SCINTILLATION COUNTERS; SILICON DETECTORS; SPECTRUM ANALYSIS; VEHICULAR TUNNELS; WINDOWS; X RAY SPECTROMETERS; X RAY SPECTROSCOPY; X RAYS;

GAMMA RAYS;

EID: 66749105123     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.788803     Document Type: Conference Paper

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