Dual-energy performance of dual-kVp in comparison to dual-layer and quantum-counting CT system concepts

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 7258, Issue , 2009, Pages

  Kappler, S ^a   Grasruck, M ^a   Niederlohnera D ^a   Strassburga, M ^a   Wirtha, S ^a  

^a SIEMENS AG   (Germany)

Author keywords

CT; CTDE; DET; SYS

Indexed keywords

CLINICAL ROUTINE; COMPUTED TOMOGRAPHY; CT; CT SCAN; CT SYSTEM; CTDE; DET; DETECTOR RESPONSE; DIRECT CONVERTER; DOSE EXPOSURE; DUAL LAYER; DUAL SOURCE; DUAL-ENERGY; DUAL-ENERGY CT; IMAGE DATA; IMAGE NOISE; IMAGE SHARPNESS; MATERIAL CLASSIFICATION; QUANTUM COUNTING; SCATTER RADIATION; SELECTIVE DETECTORS; SEPARATION POWER; SYS; X-RAY ENERGIES; X-RAY SPECTRA;

COMPUTERIZED TOMOGRAPHY; DETECTORS; IMAGE RECONSTRUCTION; IODINE; PHOTOLITHOGRAPHY;

MEDICAL IMAGING;

EID: 66749099030     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.811517     Document Type: Conference Paper

References (8)

1. T.R.C. Johnson et al., Material differentiation by dual energy CT: initial experience, Eur. Radiol. 2007, 17:1510-1517, 2007.
2. F. Kelcz et al., Noise considerations in dual energy CT scanning, Med. Phys. 6(5), 1979.
3. M. Grasruck et al., Dual energy with dual source CT and kVp switching with single source CT: a comparison of dual energy performance, Proceedings of 2009 SPIE Medical Imaging Conference, 2009.
4. B.J. Heismann et al., Spectral and Spatial Resolution of Semiconductor Detectors in Medical X- and Gamma Ray Imaging, Proceedings of 16th International Workshop on Room-Temperature Semiconductor X- and Gamma-ray Detectors, Conference Record R03[1] 78-83, 2008.
5. C. Szeles et al., Challenges of CdZnTe Semiconductor Detectors for Spectroscopic X-Ray Imaging, Invited Talk at the 16th International Workshop on Room-Temperature Semiconductor X- and Gamma-ray Detectors, Dresden, Germany, Oct 19-25, 2008.
6. Siemens AG, Healthcare Sector, Computed Tomography, Forchheim/Germany, SOMATOM Definition Flash System Owner Manual, 2009.
7. S. Kappler and S. Wirth, Comparison Of Dual-kVp And Dual-Layer CT In Simulations And Real CT System Measurements, Proceedings of IEEE Medical Imaging Conference 2008, Conference Record M10[152] 4828-4831, 2008.
8. R. Carmi et al., Material separation with dual-layer CT, Proceedings of IEEE Nuclear Science Symposium 2005, Conference Record M03[367] 1876-1878, 2005.