Comparison Of dual-kVp and dual-layer CT in simulations and real CT system measurements

IEEE Nuclear Science Symposium Conference Record

Volumn , Issue , 2008, Pages 4828-4831

  Kappler, Steffen ^a   Wirth, Stefan ^a  

^a SIEMENS AG   (Germany)

Author keywords

Computed tomography; Dual energy; Dual kVp; Dual layer; Dual source

Indexed keywords

COMPUTED TOMOGRAPHY; DUAL-ENERGY; DUAL-KVP; DUAL-LAYER; DUAL-SOURCE;

COMPUTERIZED TOMOGRAPHY;

EID: 66749169906     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2008.4774322     Document Type: Conference Paper

References (4)

1. T.R.C. Johnson et al., Material differentiation by dual energy CT: initial experience, Eur. Radiol. 2007, 17:1510-1517, 2007. (Pubitemid 46767599)
2. F. Kelcz et al., Noise considerations in dual energy CT scanning, Med. Phys. 6(5), 1979.
3. R. Carmi et al., Material separation with dual-layer CT, Proceedings of IEEE Nuclear Science Symposium 2005, Conference record M03[367] 18761878, 2005.
4. Siemens AG, Healthcare Sector, Computed Tomography, Forch- heim/Germany, SOMATOM Definition System Owner Manual, Order No. C2-028.629.05.01.02, 2008.