Crystal and layer structures of ferroelectric oligomer thin films

Macromolecules

Volumn 42, Issue 9, 2009, Pages 3353-3357

  Kuwajima, Shuichiro ^a   Horie, Satoshi ^a   Horiuchi, Toshihisa ^a   Yamada, Hirofumi ^a   Matsushige, Kazumi ^a   Ishida, Kenji ^b  

^a KYOTO UNIVERSITY   (Japan)

^b KOBE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FILM-SUBSTRATE INTERFACES; HIGH-T; LATTICE PARAMETERS; LAYER STRUCTURES; LOWER DENSITY; MONOCLINIC STRUCTURES; SILICON SUBSTRATES; SMALL CRYSTALS; SPACE GROUPS; SUBSTRATE TEMPERATURE; SURFACE TOPOLOGY; VINYLIDENE FLUORIDE; X RAY REFLECTIVITY;

CRYSTALLOGRAPHY; FERROELECTRIC FILMS; FERROELECTRICITY; LATTICE CONSTANTS; MOLECULAR ORIENTATION; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION;

CRYSTAL STRUCTURE;

EID: 66549129084     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma802639r     Document Type: Article

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