Effect of substrate temperature on molecular orientation in evaporated thin films of vinylidene fluoride oligomer

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 12 A, 1997, Pages 7389-7394

  Yoshida, Yuji ^a   Ishida, Kenji ^b   Ishizaki, Katsunori ^c   Horiuchi, Toshihisa ^b   Matsushige, Kazumi ^b  

^a NATL INST OF MAT AND CHEM RES   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c ARIAKE NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

Evaporation; Molecular orientation; Substrate temperature; Thin films; Total reflects X ray diffraction; Vinylidene fluoride oligomer

Indexed keywords

CRYSTAL STRUCTURE; EVAPORATION; FERROELECTRICITY; INFRARED SPECTROSCOPY; MOLECULAR ORIENTATION; SYNTHESIS (CHEMICAL); TEMPERATURE; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

REFLECTION ABSORPTION INFRARED SPECTROSCOPY; REFLECTION XRAY DIFFRACTOMETER; VINYLIDENE FLUORIDE OLIGOMER;

OLIGOMERS;

EID: 0031376346     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.7389     Document Type: Article

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