SCOPUS 정보 검색 플랫폼

Volumn 94, Issue 21, 2009, Pages

Direct measurement of thin-film thermoelectric figure of merit

(8) Singh, Rajeev a Bian, Zhixi a Shakouri, Ali a Zeng, Gehong b Bahk, Je Hyeong b Bowers, John E b Zide, Joshua M O c Gossard, Arthur C c

a University of California Santa Cruz (United States)

b University of California (United States)

c UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE DEVICES; DEVICE STRUCTURES; DIRECT MEASUREMENT; DYNAMIC RANGE; FINITE ELEMENT SIMULATIONS; HIGH-SPEED; INGAALAS; SURFACE TEMPERATURE MEASUREMENT; THERMAL MAPS; THERMOELECTRIC FIGURE OF MERIT; THERMOELECTRIC MATERIAL; THERMOELECTRIC PROPERTIES;

TEMPERATURE MEASUREMENT; THICK FILMS;

THERMOELECTRIC EQUIPMENT;

EID: 66549128133 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3094880 Document Type: Article

Times cited : (27)

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