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Volumn 80, Issue 5, 2009, Pages

In situ positioning of a few hundred micrometer-sized cleaved surfaces for soft-x-ray angle-resolved photoemission spectroscopy by use of an optical microscope

(12) Muro, Takayuki a Kato, Yukako a Matsushita, Tomohiro a Kinoshita, Toyohiko a Watanabe, Yoshio a Sekiyama, Akira b Sugiyama, Hiroshi b Kimura, Masato b Komori, Satoshi b Suga, Shigemasa b Okazaki, Hiroyuki c Yokoya, Takayoshi c

a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

b OSAKA UNIVERSITY (Japan)

c OKAYAMA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY; BULK SILICON; CLEAVED SURFACES; ELECTRONIC BAND; IN-SITU; OPTICAL MICROSCOPES; SOFT-X-RAY; SPATIAL RESOLUTION;

EMISSION SPECTROSCOPY; LUMINESCENCE OF ORGANIC SOLIDS; PHOTOEMISSION;

MICROSCOPES;

EID: 66549117402 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3124145 Document Type: Article

Times cited : (7)

References (7)

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