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Volumn 80, Issue 5, 2009, Pages

Characterizing the detection system nonlinearity, internal inelastic background, and transmission function of an electron spectrometer for use in x-ray photoelectron spectroscopy

(2) Wicks, R C a Ingle, N J C a

a UNIVERSITY OF BRITISH COLUMBIA (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION SYSTEM; ELECTRON SPECTROMETER; HEMISPHERICAL ANALYZERS; INTENSITY RANGE; INTERNAL INELASTIC SCATTERING; LENS SYSTEMS; LINEAR BEHAVIOR; TRANSMISSION FUNCTION;

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; SPACECRAFT INSTRUMENTS; SPECTROMETERS; SPECTROMETRY; SPECTRUM ANALYSIS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 66549111406 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3131631 Document Type: Article

Times cited : (13)

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