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Volumn 11, Issue , 2009, Pages
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Retention mechanisms and binding states of deuterium implanted into beryllium
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYTICAL TECHNIQUES;
ANNEALING TEMPERATURES;
BINDING STATE;
ELEVATED TEMPERATURE;
EXPERIMENTAL DATA;
FLUENCE;
IN-SITU;
LOW-ENERGY ION SPECTROSCOPIES;
NEAR SURFACE REGIONS;
NUCLEAR REACTION ANALYSIS;
RELEASE PROCESS;
RESIDUAL GAS;
RESIDUAL OXYGEN;
RETENTION MECHANISM;
SINGLE-CRYSTALLINE;
STEADY STATE;
SURFACE LAYERS;
SURFACE RECOMBINATIONS;
TEMPERATURE REGIMES;
THIN OXIDE FILMS;
TRAP SITES;
ACTIVATION ENERGY;
BERYLLIUM;
BINDING ENERGY;
DEUTERIUM;
IONS;
MONOLAYERS;
NUCLEAR REACTORS;
OXIDE FILMS;
OXYGEN;
SURFACE SEGREGATION;
TEMPERATURE PROGRAMMED DESORPTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 66449098200
PISSN: 13672630
EISSN: None
Source Type: Journal
DOI: 10.1088/1367-2630/11/4/043023 Document Type: Article |
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Times cited : (74)
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References (32)
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