Depth distribution of deuterium atoms and molecules in beryllium implanted with D ions

Journal of Nuclear Materials

Volumn 241-243, Issue , 1997, Pages 1047-1052

  Alimov, V Kh ^a   Chernikov, V N ^a   Zakharov, A P ^a  

^a RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BUBBLE FORMATION; DEUTERIUM; ION IMPLANTATION; SECONDARY ION MASS SPECTROMETRY; SPUTTER DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY;

LOW Z WALL MATERIAL; WALL PARTICLE RETENTION;

BERYLLIUM;

EID: 0031546595     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(96)00657-5     Document Type: Article

References (19)