Silver and gold doping of SiO2 glass by solid-state field-assisted diffusion

Journal of Non-Crystalline Solids

Volumn 355, Issue 18-21, 2009, Pages 1136-1139

  Cattaruzza, E ^a   Gonella, F ^a   Ali, S ^b   Sada, C ^b   Quaranta, A ^c  

^a CA' FOSCARI UNIVERSITY OF VENICE   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

^c UNIVERSITY OF TRENTO   (Italy)

Author keywords

Ion exchange; Secondary ion mass spectroscopy; Silica

Indexed keywords

APPLIED FIELD; DEPOSITED FILMS; EXPERIMENTAL OBSERVATION; EXTERNAL ELECTRIC FIELD; GOLD IONS; HIGH FIELD; HIGH TEMPERATURE; INTERFACE CHEMISTRY; LOCAL ELECTRIC FIELD; MATRIX; RUTHERFORD BACK-SCATTERING SPECTROMETRY; SECONDARY ION MASS SPECTROSCOPY; SILICA MATRIX;

DIFFUSION; ELECTRIC FIELDS; GLASS; GOLD; GOLD COMPOUNDS; ION EXCHANGERS; IONS; MASS SPECTROMETERS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILICA; SILVER; SPECTROMETRY;

ION EXCHANGE;

EID: 66349123221     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2009.02.012     Document Type: Article

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