Characterization of silicate glasses doped with gold by solid-state field-assisted ion exchange

Materials Science and Engineering: B

Volumn 149, Issue 2, 2008, Pages 195-199

  Cattaruzza, E ^a   Battaglin, G ^a   Gonella, F ^a   Ali, S ^b   Sada, C ^b   Quaranta, A ^c  

^a CA' FOSCARI UNIVERSITY OF VENICE   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

^c UNIVERSITY OF TRENTO   (Italy)

Author keywords

Diffusion; Electric field effect; Glass; Secondary ion mass spectrometry (SIMS)

Indexed keywords

DIFFUSION; ELECTRIC FIELD EFFECTS; SECONDARY ION MASS SPECTROMETRY; SILICATES;

LIGHT WAVEGUIDES TECHNOLOGY; SILICATE GLASSES; ULTRAFAST NONLINEAR OPTICS;

GLASS;

EID: 41649103246     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.11.025     Document Type: Article

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