Ellipsometric studies of opal crystals

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1391-1394

  Reza, A ^a,b   Tamasevicius, R ^a   Babonas, J ^a   Balevicius, Z ^a   Vaicikauskas, V ^a   Golubev, V ^c   Kurdyukov, D ^c  

^a CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^b VYTAUTAS MAGNUS UNIVERSITY   (Lithuania)

^c IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRIC PARAMETERS; ELLIPSOMETRIC SPECTRA; INDEX OF REFRACTION; OPAL PHOTONIC CRYSTALS; OPTICAL FEATURES; SPECULAR REFLECTIONS; STOP-BANDS; SYNTHETIC OPALS;

PHOTONIC CRYSTALS; REFRACTIVE INDEX; SILICON COMPOUNDS;

SPECTROSCOPIC ELLIPSOMETRY;

EID: 66349086465     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777739     Document Type: Conference Paper

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