Implementation and use of robust refinement in powder diffraction in the presence of impurities

Journal of Applied Crystallography

Volumn 42, Issue 3, 2009, Pages 385-391

  Stone, Kevin H ^a   Lapidus, Saul H ^a   Stephens, Peter W ^a  

^a STONY BROOK UNIVERSITY   (United States)

Author keywords

Least squares analysis; Powder diffraction data; Rietveld refinement; Robust refinement; Unmodeled impurities

Indexed keywords

EID: 66249140975     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889809008450     Document Type: Article

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