Robust rietveld refinement in the presence of impurity phases

Journal of Applied Crystallography

Volumn 34, Issue 6, 2001, Pages 691-698

  David, W I F ^a  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ARTICLE; BAYES THEOREM; CALCULATION; CRYSTAL STRUCTURE; MATERIAL STATE; PURIFICATION; REGRESSION ANALYSIS; X RAY POWDER DIFFRACTION;

EID: 0035204310     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889801011396     Document Type: Article

References (9)

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2. David, W. I. F. & Sivia, D. S. (2001). J. Appl. Cryst. 34, 318-324.
3. Ibberson, R. M., David, W. I. F. & Knight, K. S. (1992). Rutherford Appleton Laboratory Report, RAL-92-031.
4. Jeffreys, H. (1939). Theory of Probability. Oxford University Press.
5. Prince, E. (1982). Mathematical Techniques in Crystallography and Materials Science. Berlin: Springer Verlag.
6. Prince, E. & Nicholson, W. L. (1985). Structure and Statistics in Crystallography, pp. 183-195. New York: Adenine Press.
7. Sivia, D. S. (1996a). Dealing with Duff Data, in Proceedings of the Maximum Entropy Conference, edited by M. Sears, V. Nedeljkovic, N. E. Pendock & S. Sibisi, pp. 131-137. Port Elizabeth, South Africa: NMB printers.
8. Sivia, D. S. (1996b). Data Analysis - A Bayesian Tutorial. Oxford University Press.
9. Spagna, R. & Camalli, M. (1999). J. Appl. Cryst. 32, 934-942