Lattice parameter determination using a curved position-sensitive detector in reflection geometry and application to Smx/2Nd x/2Ce1-xO2- ceramics

Journal of Applied Crystallography

Volumn 42, Issue 3, 2009, Pages 490-495

  Pramanick, A ^a   Omar, S ^a   Nino, J C ^a   Jones, J L ^a  

^a University of Florida   (United States)

Author keywords

Ceramics; Curved position sensitive detectors; Lattice parameters; X ray diffraction

Indexed keywords

PUFFINUS AURICULARIS;

EID: 66249139595     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889809010085     Document Type: Article

References (14)

1. Cullity, B. D. & Stock, S. R. (1978). Elements of X-ray Diffraction, 3rd ed. New Jersey: Prentice Hall.
2. Deniard, P., Evain, M., Barbet, J. M. & Brec, R. (1991). Mater. Sci. Forum, 79-82, 363-370.
3. Evain, M., Deniard, P., Jouanneaux, A. & Brec, R. (1993). J. Appl. Cryst. 26, 563-569.
4. Kim, D. J. (1989). J. Am. Ceram. Soc. 72, 1415-1421.
5. Masson, O., Guinebretière, R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546.
6. Omar, S., Wachsman, E. D. & Nino, J. C. (2006). Solid State Ionics, 177, 3199-3203.
7. Omar, S., Wachsman, E. D. & Nino, J. C .(2007). Appl. Phys. Lett. 91,144106.
8. Omar, S., Wachsman, E. D. & Nino, J. C. (2008). Solid State Ionics, 178,1890-1897.
9. Parks, T. C. & Bevan, D. J. M. (1973). Rev. Chim. Miner. 10, 15-28.
10. Shannon, R. D. (1976). Acta Cryst. A32, 751-767.
11. Shishiguchi, S., Minato, I. & Hashizume, H. (1986). J. Appl. Cryst. 19, 420-426.
12. Stephens, I. E. L. & Kilner, J. A. (2006). Solid State Ionics, 177, 669-676.
13. Vegard, L. & Dale, H. (1928). Z. Kristallogr. 67, 148-162.
14. Young, R. A. (1995). The Rietveld Method. London: Oxford University Press.