![]() |
Volumn 21, Issue 23, 2009, Pages
|
Ultrathin SrTiO3 films: Epitaxy and optical properties
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ABSORPTION EDGES;
BIAXIAL IN-PLANE STRAIN;
BIAXIAL STRAINS;
CRITICAL THICKNESS;
ELLIPSOMETRIC SPECTROSCOPY;
INDUCED POLARIZATION;
INTER-BAND TRANSITION;
PSEUDOMORPHIC GROWTH;
ROOM TEMPERATURE;
SINGLE-CRYSTAL SUBSTRATES;
SPECTRAL RANGE;
SRTIO;
STRAIN STATE;
SURFACE EFFECT;
ULTRA-THIN;
VISIBLE RANGE;
CRYSTAL GROWTH;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
EPITAXIAL FILMS;
OPTICAL PROPERTIES;
POLARIZATION;
PULSED LASER DEPOSITION;
STRONTIUM ALLOYS;
OPTICAL FILMS;
|
EID: 66249096739
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/21/23/232203 Document Type: Article |
Times cited : (29)
|
References (17)
|