Effect of material selection and background impurity on interface property and resulted CIP-GMR performance

Journal of Magnetism and Magnetic Materials

Volumn 321, Issue 18, 2009, Pages 2902-2910

  Peng, Xilin ^a   Morrone, Augusto ^a   Nikolaev, Konstantin ^a   Kief, Mark ^a   Ostrowski, Mark ^a  

^a SEAGATE TECHNOLOGY   (United States)

Author keywords

AFM; CIP GMR; Interface; Lattice mismatch; SAF; Seed layer; TEM

Indexed keywords

AFM; CIP-GMR; INTERFACE; SAF; SEED LAYER; TEM;

ATOMIC FORCE MICROSCOPY; GIANT MAGNETORESISTANCE; LATTICE MISMATCH; MAGNETIC RECORDING; OXYGEN; PRESSURE EFFECTS;

GALVANOMAGNETIC EFFECTS;

EID: 66149181758     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2009.04.047     Document Type: Article

References (21)

1. Diney B., Speriosu V.S., Metin S., Parkin S.S.P., Gurney B.A., Baumgart P., and Wilhoit D.R. J. Appl. Phys. 69 (1991) 4774
2. NIKKEI Electronics, 704 (1998) 23-24.
3. Mao M., Cerjan C., and Kools J. J. Appl. Phys. 91 (2002) 8560
4. Jibouri A.A., Hoban M., Lu Z., and Pan G. J. Appl. Phys. 91 (2002) 7098
5. Seigler M.A. IEEE Trans. Magn. 43 (2007) 651
6. Parkin S.S.P., Kaiser C., Panchula A., Rice P.M., Hughes B., Samant M., and Yang S.-H. Nat. Mater. 3 (2004) 862-867
7. Yuasa S., Nagahama T., Fukshima A., Suzuki Y., and Ando K. Nat. Mater. 3 (2004) 868-871
8. Peng X., Kolbo P., Nikolaev K., Chen S., Wang Z., Boonstra T., Anderson P., Kalderon S., Czoschke P., Morrone A., Dimtrov D., Xue S., and Chen Y. J. Magn. Magn. Mater. 321 (2009) 1889
9. Zheng M., Choe G., Johnson K.E., Gao L., and Liou S.H. IEEE Trans. Magn. 38 (2002) 1979
10. Lee C.L., Devasahayam A., Mao M., Kools J., Cox P., Masaryk K., Mahenthiran D., and Munson J. J. Appl. Phys. 93 (2003) 8406
11. Lee C.L., Devasahayam A.J., Hu C.C., Zhang Y., Mao M., Kools J.C.S., and Rook K. IEEE Trans. Magn. 40 (2004) 2209
12. Fecioru-Morariu M., Güntherodt G., Rührig M., Lamperti A., and Tanner B. J. Appl. Phys. 102 (2007) 053911
13. Aley N.P., Vallejo-Fernandez G., Kroeger R., Lafferty B., Agnew J., Lu Y., and O'Grady K. IEEE Trans. Magn. 44 (2008) 2820
14. Lee W.Y., Toney M.F., and Mauri D. IEEE Trans. Magn. 36 (2000) 381
15. Fuke H.N., Saito K., Yoshikawa M., Iwasaki H., and Sahashi M. Appl. Phys. Lett. 75 (1999) 3680
16. H. Fuke, H. Fukuzawa, H. Yuasa, S. Hashimoto, H. Iwasaki, USP7289305 (Oct. 30, 2007).
17. Mehl M.J., and Papaconstantopoulos D.A. Phys. Rev. B 54 (1996) 4519
18. You C.Y., Goripati H.S., Furubayashi T., Takahashi Y.K., and Hono K. Appl. Phys. Lett. 93 (2008) 012501
19. Hashimoto A., Saito S., Itagaki N., and Takahashi M. Appl. Phys. Lett. 89 (2006) 262508
20. Shibamoto M., Yamanaka K., Djayaprawira D.D., and Watanabe N. Intermag. Asia 2005 Digest (2005) 583 April 4-8
21. Tsunoda M., Nishikawa K., Damm T., Hashimoto T., and Takahashi M. J. Magn. Magn. Mater. 239 (2002) 182