Physical properties of spin-valve films grown on naturally oxidized metal nano-oxide surfaces

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 8560-8562

  Mao, Ming ^a   Cerjan, Charlie ^b   Kools, Jacques ^a  

^a VEECO INSTRUMENTS INC   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER LAYERS; CRYSTALLOGRAPHIC QUALITY; CU LAYERS; EXCHANGE BIASING; FILM RESISTANCE; MAGNETIC TUNNEL JUNCTION; MEAN FREE PATH; MULTILAYER STRUCTURES; NANO-OXIDE LAYER; NANO-OXIDES; NATURAL OXIDATION; OSCILLATORY INTERLAYERS; SPECULAR REFLECTIONS; SPIN-POLARIZED ELECTRONS; SPIN-VALVE FILMS; ULTRA-THIN; WIDE SPECTRUM;

CHROMIUM; ELECTRIC BREAKDOWN; GIANT MAGNETORESISTANCE; IRIDIUM COMPOUNDS; MULTILAYER FILMS; NIOBIUM; NIOBIUM OXIDE; PHYSICAL PROPERTIES; TANTALUM;

COPPER;

EID: 0037094582     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1455615     Document Type: Article

References (3)

1. Y. Kamiguchi, H. Yuasa, H. Fukuzawa, K. Koi, H. Iwasaki, and M. Sahashi, Digest Intermag. 99 (1999), DB-01.
2. S. Sant, M. Mao, J. Kools, K. Koi, H. Iwasaki, and M. Sahashi, J. Appl. Phys. 89, 6931 (2001). jap JAPIAU 0021-8979
3. K. Sin, M. Mao, C. Chien, S. Funada, L. Miloslavski, H.-C. Tong, and S. Gupta, IEEE Trans. Magn. 36, 2818 (2000). emg IEMGAQ 0018-9464