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Volumn 115, Issue 1, 2009, Pages 384-386
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Correlation histograms in conductance measurements of nanowires formed at semiconductor interfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
GRAPHIC METHODS;
NANOWIRES;
CONDUCTANCE HISTOGRAM;
CONDUCTANCE MEASUREMENT;
CONDUCTANCE VALUES;
CORRELATION ANALYSIS;
FORMATION DYNAMICS;
GERMANIUM SURFACE;
HIGH REPRODUCIBILITY;
SEMICONDUCTOR INTERFACES;
SEMICONDUCTOR JUNCTIONS;
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EID: 66149137220
PISSN: 05874246
EISSN: 1898794X
Source Type: Journal
DOI: 10.12693/aphyspola.115.384 Document Type: Conference Paper |
Times cited : (8)
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References (9)
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