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Volumn 115, Issue 1, 2009, Pages 384-386

Correlation histograms in conductance measurements of nanowires formed at semiconductor interfaces

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHIC METHODS; NANOWIRES;

EID: 66149137220     PISSN: 05874246     EISSN: 1898794X     Source Type: Journal    
DOI: 10.12693/aphyspola.115.384     Document Type: Conference Paper
Times cited : (8)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.