A sensor-on-chip based on second-order optical effect of ZnO nanowires

Chinese Physics Letters

Volumn 26, Issue 1, 2009, Pages

  Zhu, Jing ^a   Zhu, Guang Ping ^a   Lu, Chang Gui ^a   Xu, Chun Xiang ^a   Cui, Yi Ping ^a  

^a SOUTHEAST UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DENSITY; II-VI SEMICONDUCTORS; NANOWIRES; PROGRAMMABLE LOGIC CONTROLLERS; SURFACE DEFECTS; ZINC OXIDE;

CHIP BASED; ELECTROSTATIC POTENTIALS; HYPER RAYLEIGH SCATTERING; ON CHIPS; SCATTERING MEASUREMENTS; SECOND ORDER OPTICAL EFFECTS; SECOND-ORDER NONLINEAR EFFECTS; SURFACE DEFECT DENSITY; ZNO NANOWIRES;

SILICON WAFERS;

EID: 66149132286     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/26/1/014204     Document Type: Article

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