Cu(In, Ga)Se2 thin films on flexible polyimide sheet: Structural and electrical properties versus composition

Chinese Physics Letters

Volumn 26, Issue 2, 2009, Pages

  Zhang, Li ^a   He, Qing ^a   Jiang, Wei Long ^a   Li, Chang Jian ^a   Sun, Yun ^a  

^a NANKAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COPPER COMPOUNDS; EFFICIENCY; OPEN CIRCUIT VOLTAGE; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION;

CIGS FILMS; CO-EVAPORATIONS; COMPOSITIONAL RATIO; EVAPORATION PROCESS; FLEXIBLE POLYIMIDE; HALL EFFECT MEASUREMENT; STRUCTURAL AND ELECTRICAL PROPERTIES; THIN-FILMS; X-RAY DIFFRACTION SPECTRUM;

POLYIMIDES;

EID: 66149083515     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/26/2/026801     Document Type: Article

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