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Integrated Ferroelectrics

Volumn 86, Issue 1, 2006, Pages 103-108

Comparison of structures and properties of bst thin films grown on lao and mao substrates

(7) Ying, Z a,b Zhou, X Y a Yun, P a Song, Z T b Feng, S L b Chan, H L W a Wang, Y a

a HONG KONG POLYTECHNIC UNIVERSITY (Hong Kong)

b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY (China)

Author keywords

Barium strontium titanate; Ferroelectric; Thin film

Indexed keywords

BA0.7SR0.3; BARIUM STRONTIUM TITANATE; BST THIN FILMS; DIELECTRIC AND FERROELECTRIC PROPERTIES; EPITAXIALLY GROWN; FERROELECTRIC; FERROELECTRIC PROPERTY; HETEROSTRUCTURES; IN-PLANE; IN-PLANE LATTICE PARAMETERS; MGAL2O4; SINGLE CRYSTAL SUBSTRATES; X- RAY DIFFRACTION;

BARIUM; CRYSTAL STRUCTURE; FERROELECTRICITY; SINGLE CRYSTALS; STRONTIUM; STRONTIUM COMPOUNDS; TECHNETIUM; THIN FILM DEVICES; THIN FILMS; TITANIUM OXIDES;

BARIUM TITANATE;

EID: 65949118256 PISSN: 10584587 EISSN: 16078489 Source Type: Journal
DOI: 10.1080/10584580601085206 Document Type: Article

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.