Finite element analysis of lossless propagation in surface plasmon polariton waveguides with nanoscale spot-sizes

Journal of Lightwave Technology

Volumn 27, Issue 9, 2009, Pages 1114-1121

  Krishnan, Ananth ^a   de Peralta, Luis Grave ^b   Holtz, Mark ^b   Bernussi, Ayrton A ^a  

^a Texas Tech University   (United States)

^b TEXAS TECH UNIVERSITY   (United States)

Author keywords

Metal semiconductor interfaces; Optical waveguides; Plasmon

Indexed keywords

DIFFRACTION LIMIT OF LIGHT; FINITE ELEMENT ANALYSIS; GAIN MEDIA; GAIN VALUES; GEOMETRICAL PARAMETERS; LOSSLESS; METAL GROOVES; METAL SEMICONDUCTOR METAL; METAL-SEMICONDUCTOR INTERFACES; NANO SCALE; PLASMON MODES; PLASMONIC WAVEGUIDES; PROPAGATION CHARACTERISTICS; SEMICONDUCTOR TECHNOLOGY; SIMULATION RESULT; SPOT SIZES; SUB-WAVELENGTH; SURFACE PLASMON-POLARITON WAVEGUIDES; WAVEGUIDE GEOMETRY; WAVEGUIDE STRUCTURE;

GEOMETRY; INTEGRATED OPTOELECTRONICS; LIGHT; METALS; NANOSTRUCTURED MATERIALS; OPTICAL WAVEGUIDES; PHOTODETECTORS; PLASMONS; SEMICONDUCTOR DEVICE MANUFACTURE; SURFACE PLASMON RESONANCE; WAVEGUIDE COMPONENTS;

STRUCTURAL METALS;

EID: 65949092196     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2008.929417     Document Type: Article

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