Shot noise measurements in graphene

Solid State Communications

Volumn 149, Issue 27-28, 2009, Pages 1050-1055

  Danneau, R ^a   Wu, F ^a   Craciun, M F ^b   Russo, S ^b   Tomi, M Y ^a   Salmilehto, J ^a   Morpurgo, A F ^c   Hakonen, P J ^a  

^a AALTO UNIVERSITY   (Finland)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

A. Nanostructures; D. Electronic transport; D. Noise

Indexed keywords

A. NANOSTRUCTURES; D. ELECTRONIC TRANSPORT; D. NOISE; DIRAC POINT; ELECTRICAL TRANSPORT; FANO FACTOR; GRAPHENE; GRAPHENE SHEETS; LENGTH RATIO; NOISE MEASUREMENTS; TEMPERATURE RANGE; THEORETICAL PREDICTION;

NANOSTRUCTURES; SHOT NOISE; SOUND REPRODUCTION;

ASPECT RATIO;

EID: 65849159507     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2009.02.046     Document Type: Article

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