News applications in authentication and traceability using ultrafastlaser marking

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7201, Issue , 2009, Pages

  Dusser, B ^a,b   Sagan, Z ^b   Foucou, A ^b   Jourlin, M ^a   Audouard, E ^a  

^a UNIVERSITÉ JEAN MONNET   (France)

^b ATT (Advanced Track and Trace)   (France)

Author keywords

Colorizing metals; Femto; Identification; Image processing; Laser pulses; Nanostructure; Polarisation; Ripple; Stainless steal; Traceability

Indexed keywords

COLORIZING METALS; FEMTO; IDENTIFICATION; POLARISATION; RIPPLE; STAINLESS STEAL; TRACEABILITY;

IMAGE ACQUISITION; IMAGING SYSTEMS; LASER PULSES; LASERS; NANOSTRUCTURES; POLARIZATION;

PULSED LASER APPLICATIONS;

EID: 65649117848     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.816886     Document Type: Conference Paper

References (9)

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