Solution-based route to semiconductor film: Well-aligned ZnSe nanobelt arrays

Thin Solid Films

Volumn 517, Issue 17, 2009, Pages 4814-4817

  Liu, Jun ^a   Xue, Dongfeng ^a  

^a DALIAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Chalcogenide compound; Semiconductor; Surface microstructure

Indexed keywords

BUILDING BLOCK; CHALCOGENIDE COMPOUND; EMISSION PEAKS; ENERGY DISPERSIVE X-RAY; ETHYLENE DIAMINE; MIXED SOLVENT; NANOBELT ARRAYS; ROOM-TEMPERATURE PHOTOLUMINESCENCE; SEMICONDUCTOR; SEMICONDUCTOR FILMS; SOLVOTHERMAL ROUTE; SURFACE MICROSTRUCTURE; TEMPLATE-FREE; THERMAL TREATMENT; WELL-ALIGNED;

HEAT TREATMENT; MICROSTRUCTURE; NANOBELTS; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; THICKNESS MEASUREMENT; ZINC;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 65649094078     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.03.021     Document Type: Article

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