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Volumn 206, Issue 5, 2009, Pages 1005-1008
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Subwavelength inhomogeneities in Cu(In,Ga)Se 2 thin films revealed by near-field scanning optical microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ANTICORRELATION;
BAND GAPS;
CU(IN , GA)SE;
DEPOSITION TECHNIQUE;
DIFFRACTION LIMITS;
FIBER PROBE;
FULL WIDTH HALF MAXIMUM;
INHOMOGENEITIES;
INHOMOGENEITY;
LATERAL VARIATIONS;
LENGTH SCALE;
OPTICAL RESOLUTION;
OPTICAL THRESHOLD;
QUASI-FERMI LEVEL;
SAMPLE SURFACE;
SIMULTANEOUS DETECTION;
SOLAR CELL ABSORBERS;
SUB-WAVELENGTH;
CONFOCAL MICROSCOPY;
COPYING;
ELECTRIC CURRENTS;
ENGINEERING GEOLOGY;
GALLIUM;
LASER EXCITATION;
LAWS AND LEGISLATION;
OPTICAL DATA STORAGE;
OPTICAL INSTRUMENTS;
PHOTOVOLTAIC CELLS;
SCANNING;
SEMICONDUCTING SELENIUM COMPOUNDS;
SOLAR ABSORBERS;
SOLAR CELLS;
SOLAR ENERGY;
SURFACE TOPOGRAPHY;
THIN FILMS;
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
DATA STORAGE;
ELECTRIC CURRENT;
GALLIUM;
GEOLOGY;
LASERS;
LEGISLATION;
MICROSCOPY;
REPROGRAPHY;
SELENIUM COMPOUNDS;
SOLAR CELLS;
SUN LIGHT;
THIN FILMS;
TOPOGRAPHY;
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EID: 65649083007
PISSN: 18626300
EISSN: 18626319
Source Type: Journal
DOI: 10.1002/pssa.200881195 Document Type: Article |
Times cited : (11)
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References (24)
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