Metal sulfide coated multiwalled carbon nanotubes synthesized by an in situ method and their optical limiting properties

Nanotechnology

Volumn 20, Issue 19, 2009, Pages

  Wu, Hui Xia ^a   Cao, Wei Man ^a   Chen, Qiang ^b   Liu, Miao Miao ^a   Qian, Shi Xiong ^b   Jia, Neng Qin ^a   Yang, Hong ^a   Yang, Shi Ping ^a  

^a SHANGHAI NORMAL UNIVERSITY   (China)

^b FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CDS; COATING LAYERS; ENERGY DISPERSIVE X-RAY SPECTROSCOPIES; HIGH-RESOLUTION TEM; IN-SITU; IN-SITU METHODS; IR SPECTRUM; MEAN SIZES; METAL SULFIDE NANOPARTICLES; METAL SULFIDES; MULTI-WALLED CARBON NANOTUBES; NON-COVALENT FUNCTIONALIZATION; OPTICAL LIMITING BEHAVIORS; OPTICAL LIMITING PROPERTIES; POLIES (DIALLYL-DIMETHYL-AMMONIUM CHLORIDE); POLYETHYLENIMINE; SELECTED AREA ELECTRON DIFFRACTIONS; STRUCTURAL MODIFICATIONS; TEM; THERMAL GRAVIMETRIC ANALYSIS; UV-VIS SPECTRUM; WET-CHEMICAL SYNTHESIS; X- RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES; Z-SCAN TECHNIQUES;

AUGER ELECTRON SPECTROSCOPY; CADMIUM COMPOUNDS; CHEMICAL MODIFICATION; CHLORINE COMPOUNDS; DIFFRACTION; GRAVIMETRIC ANALYSIS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; METAL REFINING; METALS; MULTIWALLED CARBON NANOTUBES (MWCN); POLYMERS; SILVER; SPECTRUM ANALYSIS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC SULFIDE;

CARBON NANOTUBES;

CARBON NANOTUBE; NANOCOMPOSITE; NANOPARTICLE; SULFIDE; METAL;

ARTICLE; INFRARED SPECTROSCOPY; NANOTECHNOLOGY; PRIORITY JOURNAL; ROENTGEN SPECTROSCOPY; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; REFRACTOMETRY; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; METALS; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES, CARBON; PARTICLE SIZE; REFRACTOMETRY; SULFIDES; SURFACE PROPERTIES;

EID: 65549164259     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/19/195604     Document Type: Article

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