Patterned structures of in situ size controlled CdS nanocrystals in a polymer matrix under UV irradiation

Nanotechnology

Volumn 20, Issue 15, 2009, Pages

  Fragouli, D ^a   Resta, V ^b   Pompa, P P ^a   Laera, A M ^b   Caputo, G ^a   Tapfer, L ^b   Cingolani, R ^a,c   Athanassiou, A ^a,c  

^a INFM   (Italy)

^b Centro Ricerche Brindisi   (Italy)

^c ISTITUTO ITALIANO DI TECNOLOGIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON-CHAIN LENGTHS; CDS NANOCRYSTALS; CONFOCAL MICROSCOPES; HOST POLYMERS; IN-SITU; IN-SITU FORMATIONS; LASER-INDUCED; NANO-COMPOSITE MATERIALS; NANO-DEVICES; PATTERNED STRUCTURES; POLYMER MATRICES; QUANTUM SIZES; SPATIALLY RESOLVED; THIOLATE; UV IRRADIATIONS; X-RAY DIFFRACTION MEASUREMENTS;

CADMIUM; CADMIUM COMPOUNDS; CARBON FILMS; CRYSTAL STRUCTURE; DATA STORAGE EQUIPMENT; GROWTH (MATERIALS); IRRADIATION; NANOCOMPOSITES; POLYMER FILMS; POLYMERS; TRANSMISSION ELECTRON MICROSCOPY;

NANOCRYSTALS;

CADMIUM DERIVATIVE; CADMIUM SULFIDE; CARBON; NANOCOMPOSITE; NANOCRYSTAL; POLYMER; THIOL DERIVATIVE;

ARTICLE; COMPOSITE MATERIAL; CONCENTRATION (PARAMETERS); CONFOCAL MICROSCOPY; CONTROLLED STUDY; CRYSTAL STRUCTURE; NANOFABRICATION; PARTICLE SIZE; PHOTOLUMINESCENCE; PHOTOLYSIS; PRIORITY JOURNAL; PRODUCT DEVELOPMENT; PRODUCTIVITY; QUALITY CONTROL; QUANTUM CHEMISTRY; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET IRRADIATION; X RAY DIFFRACTION;

EID: 65549151798     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/15/155302     Document Type: Article

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