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Volumn 21, Issue 11, 2009, Pages
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Photoluminescence spectral dispersion as a probe of structural inhomogeneity in silica
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON DIOXIDES;
CRYSTALLINE MATRICES;
DECAY KINETICS;
DECAY LIFE-TIME;
EMISSION BANDS;
EMISSION ENERGIES;
EMISSION LINEWIDTHS;
EMISSION SIGNALS;
EXCITED TRIPLET STATE;
FIRST MOMENTS;
INHOMOGENEITY;
MODEL SYSTEMS;
OXYGEN DEFICIENTS;
SPECTRAL DISPERSIONS;
STRUCTURAL INHOMOGENEITY;
THEORETICAL MODELS;
TIME DEPENDENCES;
TIME-RESOLVED PHOTOLUMINESCENCES;
TRIPLET EMISSIONS;
AMORPHOUS SILICON;
CORUNDUM;
LIGHT EMISSION;
OPTICAL PROPERTIES;
OXYGEN;
PHOTOLUMINESCENCE;
POINT DEFECTS;
PROBES;
SAPPHIRE;
SILICA;
LEAKAGE (FLUID);
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EID: 65549147745
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/21/11/115803 Document Type: Article |
Times cited : (3)
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References (24)
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