X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films

Wuli Xuebao/Acta Physica Sinica

Volumn 58, Issue 4, 2009, Pages 2742-2745

  Li, Yong Hua ^a   Meng, Fan Ling ^a,b   Liu, Chang Sheng ^c   Zheng, Wei Tao ^b   Wang, Yu Ming ^b  

^a HARBIN ENGINEERING UNIVERSITY   (China)

^b Jilin University   (China)

^c NORTHEASTERN UNIVERSITY   (China)

Author keywords

NiTi alloy film; Phase transformation; X ray diffraction; X ray photoelectron spectroscopy

Indexed keywords

EID: 65449189835     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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