Experimental study of a silver layer on an antireflection subwavelength-structured surface

IEEE Photonics Technology Letters

Volumn 20, Issue 13, 2008, Pages 1196-1198

  Ting, Chia Jen ^a,b   Chen, Chi Feng ^c   Chou, C P ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^c NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

Antireflection; Heat insulation; Nanostructure; Subwavelength structure

Indexed keywords

ANTIREFLECTION; EXPERIMENTAL STUDIES; HEAT INSULATION; HIGH TRANSMITTANCES; INFRARED RANGES; MICRO-REPLICATION PROCESS; OPTICAL CHARACTERISTICS; SILVER LAYERS; STRUCTURED SURFACES; SUB WAVELENGTHS; SUBWAVELENGTH STRUCTURE; VISIBLE SPECTRAL RANGES;

NANOSTRUCTURES; OPTICAL MATERIALS; REACTIVE ION ETCHING; REFLECTION;

SILVER;

EID: 65449188652     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2008.925185     Document Type: Article

References (7)

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