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Volumn 58, Issue 4, 2009, Pages 2631-2636
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A novel interconnect crosstalk RLC analytic model based on the nanometer CMOS technology
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Author keywords
Interconnect crosstalk; Nanometer CMOS; Parallel; RLC anayzable model
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Indexed keywords
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EID: 65449151927
PISSN: 10003290
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (16)
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References (19)
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