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Volumn 58, Issue 4, 2009, Pages 2631-2636

A novel interconnect crosstalk RLC analytic model based on the nanometer CMOS technology

Author keywords

Interconnect crosstalk; Nanometer CMOS; Parallel; RLC anayzable model

Indexed keywords


EID: 65449151927     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (16)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.