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Volumn 76, Issue 3, 2009, Pages 147-149

Using digital holographic microscopy to study transparent thin films

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COATINGS; ALUMINUM NITRIDE; COATINGS; HOLOGRAPHY; MICROSCOPES; MICROSCOPIC EXAMINATION; OPTICAL FILMS; PHASE MEASUREMENT; SUBSTRATES; SURFACE DEFECTS;

EID: 65449130461     PISSN: 10709762     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOT.76.000147     Document Type: Article
Times cited : (6)

References (3)
  • 1
    • 17444376029 scopus 로고    scopus 로고
    • Holographic methods of three-dimensional visualization of microscopic phase objects
    • T. V. Tishko, V. P. Titar', and D. N. Tishko, "Holographic methods of three-dimensional visualization of microscopic phase objects," Opt. Zh. 72, No. 2, 48 2005 J. Opt. Technol. 72, 203 2005.
    • (2005) Opt. Zh. 72, No. 2, 48 2005 J. Opt. Technol , vol.72 , pp. 203
    • Tishko, T.V.1    Titar, V.P.2    Tishko, D.N.3
  • 3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.