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Volumn 76, Issue 3, 2009, Pages 147-149
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Using digital holographic microscopy to study transparent thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM COATINGS;
ALUMINUM NITRIDE;
COATINGS;
HOLOGRAPHY;
MICROSCOPES;
MICROSCOPIC EXAMINATION;
OPTICAL FILMS;
PHASE MEASUREMENT;
SUBSTRATES;
SURFACE DEFECTS;
ALUMINUM NITRIDE (ALN);
DIGITAL HOLOGRAPHIC MICROSCOPY;
HOLOGRAPHIC INTERFERENCE;
QUANTITATIVE MEASUREMENT;
THIN TRANSPARENT FILMS;
THREE DIMENSIONAL IMAGES;
TRANSPARENT SUBSTRATE;
TRANSPARENT THIN FILM;
THIN FILMS;
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EID: 65449130461
PISSN: 10709762
EISSN: None
Source Type: Journal
DOI: 10.1364/JOT.76.000147 Document Type: Article |
Times cited : (6)
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References (3)
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