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Volumn 603, Issue 1-2, 2009, Pages 50-51
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Real-time speckle metrology using terahertz free electron laser radiation
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Author keywords
Free electron laser; Speckle photography; Terahertz imaging
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Indexed keywords
COHERENT RADIATIONS;
LOGARITHMIC DECREMENTS;
MICRO BOLOMETERS;
REPETITION RATES;
SPECKLE METROLOGIES;
SPECKLE PHOTOGRAPHY;
SPECKLED IMAGES;
SPECTRAL REGIONS;
TERAHERTZ;
TERAHERTZ IMAGING;
FOCAL PLANE ARRAYS;
FREE ELECTRON LASERS;
HOLOGRAPHY;
LASERS;
PHOTOGRAPHY;
SPECKLE;
ELECTRONS;
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EID: 65449119118
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2008.12.235 Document Type: Article |
Times cited : (8)
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References (6)
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