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Volumn 603, Issue 1-2, 2009, Pages 50-51

Real-time speckle metrology using terahertz free electron laser radiation

Author keywords

Free electron laser; Speckle photography; Terahertz imaging

Indexed keywords

COHERENT RADIATIONS; LOGARITHMIC DECREMENTS; MICRO BOLOMETERS; REPETITION RATES; SPECKLE METROLOGIES; SPECKLE PHOTOGRAPHY; SPECKLED IMAGES; SPECTRAL REGIONS; TERAHERTZ; TERAHERTZ IMAGING;

EID: 65449119118     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2008.12.235     Document Type: Article
Times cited : (8)

References (6)
  • 1
    • 0001096611 scopus 로고    scopus 로고
    • Principles of holographic interferometry and speckle metrology
    • Rastogi P.K. (Ed), Springer, Berlin
    • Rastogi P.K. Principles of holographic interferometry and speckle metrology. In: Rastogi P.K. (Ed). Photomechanics, Top. Appl. Phys. vol. 77 (2000), Springer, Berlin 103
    • (2000) Photomechanics, Top. Appl. Phys. , vol.77 , pp. 103
    • Rastogi, P.K.1
  • 6
    • 0002068881 scopus 로고
    • Statistical properties of laser speckle patterns
    • Dainty J.C. (Ed), Springer, New York
    • Goodman J.W. Statistical properties of laser speckle patterns. In: Dainty J.C. (Ed). Laser Speckle and Related Phenomena (1975), Springer, New York 9
    • (1975) Laser Speckle and Related Phenomena , pp. 9
    • Goodman, J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.