Benchmarking x-ray phase contrast imaging for icf D-T ice characterization using roughened surrogates

Fusion Science and Technology

Volumn 55, Issue 3, 2009, Pages 260-268

  Dewald, E ^a   Kozioziemski, B ^a   Moody, J ^a   Koch, J ^a   Mapoles, E ^a   Montesanti, R ^a   Youngblood, K ^b   Letts, S ^a   Nikroo, A ^b   Sater, J ^a   Atherton, J ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b GENERAL ATOMICS   (United States)

Author keywords

Atomic force microscopy; Cryogenic deuterium tritium layered capsules; X ray phase contrast radiography

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEUTERIUM; ICE; SURFACE ROUGHNESS; TRITIUM;

CRYOGENIC DEUTERIUM; DEUTERIUM-TRITIUM; PHASE CONTRAST X-RAY IMAGING; SINUSOIDAL PERTURBATIONS; SURFACE CHARACTERIZATION; X RAY MEASUREMENTS; X RAY PHASE CONTRAST; X-RAY PHASE-CONTRAST IMAGING;

X RAY RADIOGRAPHY;

EID: 65349175608     PISSN: 15361055     EISSN: None     Source Type: Journal    
DOI: 10.13182/FST08-3458     Document Type: Conference Paper

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