The application of synthetic focusing for imaging crack-like defects in pipelines using guided waves

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 56, Issue 4, 2009, Pages 759-770

  Davies, Jacob ^a   Cawley, Peter ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AXIAL DEFECTS; BACKSCATTERED SIGNALS; CIRCUMFERENTIAL CRACKS; CRACK-LIKE DEFECTS; DEFECT DEPTHS; DEFECT IMAGES; FINITE ELEMENT SIMULATIONS; GUIDED WAVES; INSPECTION FREQUENCIES; LABORATORY EXPERIMENTS; PIPE WALLS; POINT OF INTERESTS; SNR IMPROVEMENTS; WELD CAPS;

CRACK DETECTION; GUIDED ELECTROMAGNETIC WAVE PROPAGATION; OPTOELECTRONIC DEVICES; PIEZOELECTRIC TRANSDUCERS; PIPE; PIPELINES;

CRACKS;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; ECHOGRAPHY; EQUIPMENT; FLOW KINETICS; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY;

ALGORITHMS; EQUIPMENT FAILURE ANALYSIS; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MATERIALS TESTING; RHEOLOGY; ULTRASONOGRAPHY;

EID: 65349145281     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2009.1098     Document Type: Article

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